Quad Row & Grid Array

QFN, LCC, BGA, LGA

Flat package types like QFN, LCC, BGA, LGA that have contact pads can be tested in singulated form in strips or in diced strips.

APOLLON

When singulated, the DUTs (QFN, LCC, BGA, LGA ) are placed on carriers and can be tested with strip level test cell APOLLON.   Same is applicable also for testing of whole strips.

AIOLOS & KRONOS

Testing of QFN, LCC, BGA, LGA packages is also possible with wafer level test system. In this case the strips are placed on film frame for testing, before or after dicing. Film frame size up to 8” are applicable for  KRONOS   and AIOLOS  systems.

Related products

APOLLON is a tri-temp strip level test system for motion sensors.
AIOLOS - Wafer level test handler for environmental sensors with with physical stimulus
 
KRONOS - Wafer level test handler for 6/9DOF sensors with real stimulus.