MEMS TESTING HANDLERS

Afore supplies MEMS testing handlers for strip/lead frame and wafer level testing. Both of these combined with our TOTA (Test On TApe) method also enable testing of singulated components. We have long experience in both. The first lead frame level handler for accelerometer testing was in production in the beginning of 2000's and the first wafer level tester for pressure sensors already in late 90's. After that we have realized several advanced products, some of which you can find in these pages. Please find the links to the presentation videos on the material page.

We have always followed our "Meant for MEMS" –philosophy in our products. This has yielded handlers with extraordinary good capability and reliable operation.

We will also want to emphasis our skills to modify our existing products or create new ones in order to fulfill Customer’s needs.