Temperature

Temperature testing is of importance in testing and calibration of high performance MEMS sensors. All AFORE handlers and test cells may be equipped with enhanced temperature testing facilities.

AFORE states that there are three important factors to look at in temperature testing:

    1. Temperature accuracy, which in AFOREs case can reach ±1°C - this is not possible with local heating of DUT

    2. Temperature uniformity - all the DUTs have to be in the same test temperature - AFORE knows how

    3. Temperature Soaking - DUT heating/ cooling time varies based on on package type - it may take surprisingly long time before the DUT is thoroughly heated/cooled.

For automotive and industrial grade sensors, AFORE offers a solution with large soaking capacity for long soaking times without losing the test capacity 

 

APOLLON –  strip handler for 6 DOF sensors
     Tri-temperature handler with temperature chamber
     Temperature range - 50 ... + 150 deg C

KRONOS –  wafer level handler for 6 /9DOF sensors
     Hot temperature chuck
     Temperature range ambient ...+ 85 deg C
     Others on request

AIOLOS –  wafer level handler for environment sensors
     Hot temperature chuck
     Temperature range ambient ...+ 85 deg C
     Others on request

Related products

APOLLON is a tri-temp strip level test system for motion sensors.
AIOLOS - Wafer level test handler for environmental sensors with with physical stimulus
 
KRONOS - Wafer level test handler for 6/9DOF sensors with real stimulus.