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Explains why Wafer Level Test Handler is such an excellent response to sensor miniaturization, high UPH  and low cost of test (COT)
Accurate yaw rate stimulus requires not only good control of the handler, but well aligned DUT and low noise testing conditions. Infinite turning range helps to achieve higher yaw rates and gives more time to measure.
Presentation explains why multiple touchdown method gives much higher UPH than Single touchdown method used by traditional gravity and pick&place handlers
Turning accuracy, DUT allignment and electrical and mechanical noise during testing and calibration have an impact to sensor performance