Prober with physical stimulus (= Wafer Level Test Handler) is an excellent response to the market demand of lower cost of test (COT) and to the challenges of sensor miniaturization.
WAFER LEVEL TEST HANDLER - WHAT IS IT ?
Wafer level handler loads the DUTs on film frames, whether in diced or un-diced form (or bare wafers)
Applies real physical stimulus while probing
Capable also for final testing (not only MEMS elements)
The only feasible solution for WLCSP testing?
Also capable of testing conventional package types
WHY PROBER WITH REAL STIMULUS - GAINS:
All this leads to the lowest COT
AFORE has two Wafer level product families KRONOS for 9DOF motion sensors and AIOLOS for environmental sensors
Learn more about Wafer level benefits